SEM

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Scanning Electron Microscopy with Energy Dispersive X-ray Spectroscopy  (SEM-EDX) is a technique for analyzing the elements present near the surface of a selected microscopic region of a sample.  Using the SEM image to select the area of interest, an energy dispersive detector is used to measure the energies of backscattered x-rays which are characteristic of the elements present. 

Instrumentation: 

     JEOL JSM 6510-LV Scanning Electron Microscope with MOXTEK 550i thin film coated IXRF energy dispersive spectrometer

Specifications:

          Magnification: 5´ - 300,000´

          Resolution: 4 nm