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Southern Kentucky Center for Advanced Microscopy

WKU Southern Kentucky Center for Advanced Microscopy

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WKU has acquired a suite of advanced microscopes like the Scanning Electron Microscope (SEM), Large Chamber – Scanning Electron Microscope (LC-SEM), Atomic Force Microscope (AFM) and a brand new Laser Scanning Confocal Microscope (LSCM). Unfortunately, while available at WKU these advanced microscopes are spread across five locations which is conducive to its maintenance but do not make it very visible and accessible to potential internal, external users and customers. Ongoing discussions between Dr. Srivastava and Dr. Webb resulted in the idea of consolidating all the microscopic capabilities under one administrative umbrella. Subsequent conversations between ARTP and WKU administration reinforced the need to organize microscopy capabilities at WKU under one umbrella.

  SKYCAM will streamline information on microscopy capabilities for dissemination to a regional audience for marketing and branding purposes. This organization of microscopy capabilities under one umbrella organization will not result in any change in the physical location of the instruments nor a change in any personnel. SKYCAM will merely facilitate awareness (marketing and branding) of WKU capabilities in microscopy to our current and potential customers and allow us to seek potential business opportunities.

Our Mission


SKYCAM Microscopes


AFM Microscope

Agilent 5500 Atomic Force Microscope for surface imaging at the nanometer scale & Nanosurf FlexAFM Microscope for surface imaging below the nanometer scale.





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Confocal Microscope

Leica TCS SP8 Laser Scanning Confocal Microscope with four laser lines and associated optics.






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Unit can handle complete parts up to 1.5 meters Square and weighing up to 600 lbs. of weight EDX, EHT and Backscatter Detectors are on board with other types available EBDX (crystal structure) ECT.




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STEM Microscope

JEOL 1400PLUS 120kV Transmission electron microscope with an IXRF energy dispersive x-ray spectrometer and cryo-fin & JEOL 6510LV 30kV Scanning electron microscope with an IXRF energy dispersive X-ray spectrometer supporting both secondary electron and backscattered electron imaging.


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SKYCAM Contact



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 Last Modified 4/2/24