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SKYCAM Atomic Force Microscopy

SKYCAM Atomic Force Microscopy



  • Agilent 5500 Atomic Force Microscope for surface imaging at the nanometer scale.


  • Acquired around 2004, NSF DMR-MRI grant in 2005 – purchased/installed 2006 (-scb)


  • NSF DMR-0520789 from the Division of Materials Research Funded at $217,442


Capabilities of Microscope


  • The instrument is for surface imaging at the nanometer scale. It can do contact and non-contact modes.


Technical Description


  • The sample is loaded into the instrument beneath the scanner that holds the AFM probe. The probe has a cantilever and tip on it. The instrument software slowly guides the placement of the tip and gently puts it in contact with the sample surface. A laser reflects off the cantilever and hits the detector to generate the image as the tip moves over the surface of the sample. 


Service Fees


  • Students no charge. 


  • No customer samples for this instrument, However, our 2016 price was $250/sample.


Please contact Pauline Norris (hackpr@wku.edu) for more information about pricing and the instrument.

AFM Contact


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AFM microscope

Atomic Force Microscopy Front View


afm image

Atomic Force Microscopy Top View


Human Hair

Human Hair Image Taken using the Microscope




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 Last Modified 11/6/22