Description

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• Agilent 5500 Atomic Force Microscope for surface imaging at the nanometer scale.

 

• Acquired around 2004, NSF DMR-MRI grant in 2005 – purchased/installed 2006 (-scb)

 

• NSF DMR-0520789 from the Division of Materials Research Funded at $217,442

 

Capabilities of Microscope

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• The instrument is for surface imaging at the nanometer scale. It can do contact and non-contact modes.

 

Technical Description

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• The sample is loaded into the instrument beneath the scanner that holds the AFM probe. The probe has a cantilever and tip on it. The instrument software slowly guides the placement of the tip and gently puts it in contact with the sample surface. A laser reflects off the cantilever and hits the detector to generate the image as the tip moves over the surface of the sample. 

 

Service Fees

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• Students no charge. 

 

• No customer samples for this instrument, However, our 2016 price was $250/sample.

 

Please contact Pauline Norris (hackpr@wku.edu) for more information about pricing and the instrument.

AFM Contact

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Atomic Force Microscopy Front View

 

Atomic Force Microscopy Top View

 

Human Hair Image Taken using the Microscope